Fingerprint
Dive into the research topics of 'New experimental findings on process-induced hot-carrier degradation of deep-submicron N-MOSFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
New experimental findings on process-induced hot-carrier degradation of deep-submicron N-MOSFETs
D. Y.C. Lie, J. Yota, W. Xia, A. B. Joshi, R. A. Williams, R. Zwingman, L. Chung, D. L. Kwong
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
10
Scopus
citations