New experimental findings on process-induced hot-carrier degradation of deep-submicron N-MOSFETs

D. Y.C. Lie, J. Yota, W. Xia, A. B. Joshi, R. A. Williams, R. Zwingman, L. Chung, D. L. Kwong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

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Engineering & Materials Science