Multipactor thresholds in a planar test cell

Zachary C. Shaw, Benedikt Esser, James C. Dickens, John J. Mankowski, Andreas A. Neuber

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A planar test cell was designed and implemented to observe the multipactor effect in waveguide structures. This plug and play device allows for multiple geometries to be machined and easily replaced within the test structure. A direct detection method was used to observe the multipactor effect while the upper and lower thresholds were measured for a 2.1 mm gap at 2.85 GHz. While there is an obvious lower limit to multipactor (2 kW), there was no observable upper limit even at powers over 200 kW. This is attributed to the transverse electric field distribution in the dominant TE10 mode which is not taken into account in most multipactor theoretical models.

Original languageEnglish
Title of host publication2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages35-36
Number of pages2
ISBN (Electronic)9781538682883
DOIs
StatePublished - Oct 19 2020
Event21st IEEE International Conference on Vacuum Electronics, IVEC 2020 - Monterey, United States
Duration: Oct 19 2020Oct 22 2020

Publication series

Name2020 IEEE 21st International Conference on Vacuum Electronics, IVEC 2020

Conference

Conference21st IEEE International Conference on Vacuum Electronics, IVEC 2020
Country/TerritoryUnited States
CityMonterey
Period10/19/2010/22/20

Keywords

  • Electron multiplier tube
  • High power microwaves
  • Multipactor

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