Modular Marx generator for dV/dt testing of power semiconductor devices

William Ray, James Schrock, Kevin Lawson, Stephen Bayne

Research output: Contribution to conferencePaper

Original languageEnglish
StatePublished - Dec 2015

Fingerprint Dive into the research topics of 'Modular Marx generator for dV/dt testing of power semiconductor devices'. Together they form a unique fingerprint.

  • Cite this