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Micro-Raman scattering from hexagonal GaN, AlN, and AlxGa1-xN grown on (111) oriented silicon: Stress mapping of cracks
C. Ramkumar, T. Prokofyeva, M. Seon, M. Holtz, K. Choi, J. Yun, S. A. Nikishin, H. Temkin
Research output: Contribution to journal › Article › peer-review
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Scopus
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