Mg acceptor level in InN epilayers probed by photoluminescence

N. Khan, N. Nepal, A. Sedhain, J. Y. Lin, H. X. Jiang

Research output: Contribution to journalArticlepeer-review

28 Scopus citations


Mg-doped InN epilayers were grown on sapphire substrates by metal organic chemical vapor deposition. Effects of Mg concentration on the photoluminescence (PL) emission properties have been investigated. An emission line at ∼0.76 eV, which was absent in undoped InN epilayers and was about 60 meV below the band-to-band emission peak at ∼0.82 eV, was observed to be the dominant emission in Mg-doped InN epilayers. The PL spectral peak position and the temperature dependent emission intensity corroborated each other and suggested that the Mg acceptor level in InN is about 60 meV above the valance band maximum.

Original languageEnglish
Article number012101
JournalApplied Physics Letters
Issue number1
StatePublished - 2007


Dive into the research topics of 'Mg acceptor level in InN epilayers probed by photoluminescence'. Together they form a unique fingerprint.

Cite this