Measurement of the inclusive semielectronic [Formula presented] branching fraction

Y. Kubota, M. Lattery, J. K. Nelson, S. Patton, R. Poling, T. Riehle, V. Savinov, R. Wang, M. S. Alam, I. J. Kim, Z. Ling, A. H. Mahmood, J. J. O'Neill, H. Severini, C. R. Sun, S. Timm, F. Wappler, G. Crawford, J. E. Duboscq, R. FultonD. Fujino, K. K. Gan, K. Honscheid, H. Kagan, R. Kass, J. Lee, M. Sung, C. White, R. Wanke, A. Wolf, M. M. Zoeller, X. Fu, B. Nemati, W. R. Ross, P. Skubic, M. Wood, M. Bishai, J. Fast, E. Gerndt, J. W. Hinson, T. Miao, D. H. Miller, M. Modesitt, E. I. Shibata, I. P.J. Shipsey, P. N. Wang, L. Gibbons, S. D. Johnson, Y. Kwon, S. Roberts, E. H. Thorndike, T. E. Coan, J. Dominick, V. Fadeyev, I. Korolkov, M. Lambrecht, S. Sanghera, V. Shelkov, R. Stroynowski, I. Volobouev, G. Wei, M. Artuso, M. Gao, M. Goldberg, D. He, N. Horwitz, S. Kopp, G. C. Moneti, R. Mountain, F. Muheim, Y. Mukhin, S. Playfer, T. Skwarnicki, S. Stone, X. Xing, J. Bartelt, S. E. Csorna, V. Jain, S. Marka, D. Gibaut, K. Kinoshita, P. Pomianowski, S. Schrenk, B. Barish, M. Chadha, S. Chan, D. F. Cowen, G. Eigen, J. S. Miller, C. O'Grady, J. Urheim, A. J. Weinstein, F. Würthwein, D. M. Asner, M. Athanas, D. W. Bliss, W. S. Brower, G. Masek, H. P. Paar, J. Gronberg, C. M. Korte, R. Kutschke, S. Menary, R. J. Morrison, S. Nakanishi, H. N. Nelson, T. K. Nelson, C. Qiao, J. D. Richman, D. Roberts, A. Ryd, H. Tajima, M. S. Witherell, R. Balest, K. Cho, W. T. Ford, M. Lohner, H. Park, P. Rankin, J. Roy, J. G. Smith, J. P. Alexander, C. Bebek, B. E. Berger, K. Berkelman, K. Bloom, T. E. Browder, D. G. Cassel, H. A. Cho, D. M. Coffman, D. S. Crowcroft, M. Dickson, P. S. Drell, D. J. Dumas, R. Ehrlich, R. Elia, P. Gaidarev, B. Gittelman, S. W. Gray, D. L. Hartill, B. K. Heltsley, S. Henderson, C. D. Jones, S. L. Jones, J. Kandaswamy, N. Katayama, P. C. Kim, D. L. Kreinick, T. Lee, Y. Liu, G. S. Ludwig, J. Masui, J. Mevissen, N. B. Mistry, C. R. Ng, E. Nordberg, J. R. Patterson, D. Peterson, D. Riley, A. Soffer, C. Ward, P. Avery, A. Freyberger, K. Lingel, C. Prescott, J. Rodriguez, S. Yang, J. Yelton, G. Brandenburg, D. Cinabro, T. Liu, M. Saulnier, R. Wilson, H. Yamamoto, T. Bergfeld, B. I. Eisenstein, J. Ernst, G. E. Gladding, G. D. Gollin, M. Palmer, M. Selen, J. J. Thaler, K. W. Edwards, K. W. McLean, M. Ogg, A. Bellerive, D. I. Britton, E. R.F. Hyatt, R. Janicek, D. B. MacFarlane, P. M. Patel, B. Spaan, A. J. Sadoff, R. Ammar, P. Baringer, A. Bean, D. Besson, D. Coppage, N. Copty, R. Davis, N. Hancock, S. Kotov, I. Kravchenko, N. Kwak

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Abstract

Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

Original languageEnglish
Pages (from-to)2994-3005
Number of pages12
JournalPhysical Review D - Particles, Fields, Gravitation and Cosmology
Volume54
Issue number5
DOIs
StatePublished - 1996

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    Kubota, Y., Lattery, M., Nelson, J. K., Patton, S., Poling, R., Riehle, T., Savinov, V., Wang, R., Alam, M. S., Kim, I. J., Ling, Z., Mahmood, A. H., O'Neill, J. J., Severini, H., Sun, C. R., Timm, S., Wappler, F., Crawford, G., Duboscq, J. E., ... Kwak, N. (1996). Measurement of the inclusive semielectronic [Formula presented] branching fraction. Physical Review D - Particles, Fields, Gravitation and Cosmology, 54(5), 2994-3005. https://doi.org/10.1103/PhysRevD.54.2994