Markov source based test length optimized SCAN-BIST architecture

Aftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Markov sources have been shown to be efficient pseudorandom pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-atault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.

Original languageEnglish
Title of host publicationProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
Pages708-713
Number of pages6
DOIs
StatePublished - 2009
Event10th International Symposium on Quality Electronic Design, ISQED 2009 - San Jose, CA, United States
Duration: Mar 16 2009Mar 18 2009

Publication series

NameProceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Conference

Conference10th International Symposium on Quality Electronic Design, ISQED 2009
CountryUnited States
CitySan Jose, CA
Period03/16/0903/18/09

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  • Cite this

    Farooqi, A., Gale, R. O., Reddy, S. M., Nutter, B., & Monico, C. (2009). Markov source based test length optimized SCAN-BIST architecture. In Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009 (pp. 708-713). [4810380] (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009). https://doi.org/10.1109/ISQED.2009.4810380