Markov source based test length optimized SCAN-BIST architecture

Aftab Farooqi; Richard O. Gale; Sudhakar M. Reddy; Brian Nutter; Chris Monico

doi:10.1109/ISQED.2009.4810380

Markov source based test length optimized SCAN-BIST architecture

Aftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Markov sources have been shown to be efficient pseudorandom pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-atault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.

Original language	English
Title of host publication	Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
Pages	708-713
Number of pages	6
DOIs	https://doi.org/10.1109/ISQED.2009.4810380
State	Published - 2009
Event	10th International Symposium on Quality Electronic Design, ISQED 2009 - San Jose, CA, United States Duration: Mar 16 2009 → Mar 18 2009

Publication series

Name	Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

Conference

Conference	10th International Symposium on Quality Electronic Design, ISQED 2009
Country/Territory	United States
City	San Jose, CA
Period	03/16/09 → 03/18/09

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10.1109/ISQED.2009.4810380

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Farooqi, A., Gale, R. O., Reddy, S. M., Nutter, B., & Monico, C. (2009). Markov source based test length optimized SCAN-BIST architecture. In Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009 (pp. 708-713). Article 4810380 (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009). https://doi.org/10.1109/ISQED.2009.4810380

@inproceedings{cead764afc4a4b5a9201d72e29e967dc,

title = "Markov source based test length optimized SCAN-BIST architecture",

abstract = "Markov sources have been shown to be efficient pseudorandom pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-atault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.",

author = "Aftab Farooqi and Gale, {Richard O.} and Reddy, {Sudhakar M.} and Brian Nutter and Chris Monico",

year = "2009",

doi = "10.1109/ISQED.2009.4810380",

language = "English",

isbn = "9781424429530",

series = "Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009",

pages = "708--713",

booktitle = "Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009",

note = "10th International Symposium on Quality Electronic Design, ISQED 2009 ; Conference date: 16-03-2009 Through 18-03-2009",

}

Farooqi, A, Gale, RO, Reddy, SM, Nutter, B & Monico, C 2009, Markov source based test length optimized SCAN-BIST architecture. in Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009., 4810380, Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009, pp. 708-713, 10th International Symposium on Quality Electronic Design, ISQED 2009, San Jose, CA, United States, 03/16/09. https://doi.org/10.1109/ISQED.2009.4810380

Markov source based test length optimized SCAN-BIST architecture. / Farooqi, Aftab; Gale, Richard O.; Reddy, Sudhakar M. et al.
Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009. 2009. p. 708-713 4810380 (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Gale, Richard O.

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PY - 2009

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N2 - Markov sources have been shown to be efficient pseudorandom pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-atault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.

AB - Markov sources have been shown to be efficient pseudorandom pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-atault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.

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T3 - Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

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BT - Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009

T2 - 10th International Symposium on Quality Electronic Design, ISQED 2009

Y2 - 16 March 2009 through 18 March 2009

ER -

Markov source based test length optimized SCAN-BIST architecture

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