Magnetic properties of Pd0.996Mn0.004 films for high resolution thermometry

Raymond C. Nelson; C. V. Green; D. A. Sergatskov; R. V. Duncan

doi:10.1063/1.2355097

Magnetic properties of Pd_0.996Mn_0.004 films for high resolution thermometry

Raymond C. Nelson, C. V. Green, D. A. Sergatskov, R. V. Duncan

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We have previously reported on the temperature and magnetic field dependence of the magnetic susceptibility of thin Pd_1-xMn_x alloy films. Extensive new measurements on sputtered films show that a commercial quality sputtering process produces a film with the same dependence of Curie temperature on x as previously reported for bulk samples of the same material. These measurements and parameters from the Renormalization Group theory for a Heisenberg ferromagnet, yield an estimate for T_c of 1.16 ± 0.01 K when x - 0.004, consistent with previously reported bulk results.

Original language	English
Title of host publication	LOW TEMPERATURE PHYSICS
Subtitle of host publication	24th International Conference on Low Temperature Physics - LT24
Pages	1123-1124
Number of pages	2
DOIs	https://doi.org/10.1063/1.2355097
State	Published - 2006
Event	LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, United States Duration: Aug 10 2006 → Oct 17 2006

Publication series

Name	AIP Conference Proceedings
Volume	850
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
Country	United States
City	Orlando, FL
Period	08/10/06 → 10/17/06

Keywords

Magnetic thermometry
Thin films

Access to Document

10.1063/1.2355097

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title = "Magnetic properties of Pd0.996Mn0.004 films for high resolution thermometry",

abstract = "We have previously reported on the temperature and magnetic field dependence of the magnetic susceptibility of thin Pd1-xMnx alloy films. Extensive new measurements on sputtered films show that a commercial quality sputtering process produces a film with the same dependence of Curie temperature on x as previously reported for bulk samples of the same material. These measurements and parameters from the Renormalization Group theory for a Heisenberg ferromagnet, yield an estimate for Tc of 1.16 ± 0.01 K when x - 0.004, consistent with previously reported bulk results.",

keywords = "Magnetic thermometry, Thin films",

author = "Nelson, {Raymond C.} and Green, {C. V.} and Sergatskov, {D. A.} and Duncan, {R. V.}",

year = "2006",

doi = "10.1063/1.2355097",

language = "English",

isbn = "0735403473",

series = "AIP Conference Proceedings",

pages = "1123--1124",

booktitle = "LOW TEMPERATURE PHYSICS",

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Nelson, RC, Green, CV, Sergatskov, DA & Duncan, RV 2006, Magnetic properties of Pd_0.996Mn_0.004 films for high resolution thermometry. in LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24. AIP Conference Proceedings, vol. 850, pp. 1123-1124, LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24, Orlando, FL, United States, 08/10/06. https://doi.org/10.1063/1.2355097

Magnetic properties of Pd_0.996Mn_0.004 films for high resolution thermometry. / Nelson, Raymond C.; Green, C. V.; Sergatskov, D. A.; Duncan, R. V.

LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24. 2006. p. 1123-1124 (AIP Conference Proceedings; Vol. 850).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Green, C. V.

AU - Sergatskov, D. A.

AU - Duncan, R. V.

PY - 2006

Y1 - 2006

N2 - We have previously reported on the temperature and magnetic field dependence of the magnetic susceptibility of thin Pd1-xMnx alloy films. Extensive new measurements on sputtered films show that a commercial quality sputtering process produces a film with the same dependence of Curie temperature on x as previously reported for bulk samples of the same material. These measurements and parameters from the Renormalization Group theory for a Heisenberg ferromagnet, yield an estimate for Tc of 1.16 ± 0.01 K when x - 0.004, consistent with previously reported bulk results.

AB - We have previously reported on the temperature and magnetic field dependence of the magnetic susceptibility of thin Pd1-xMnx alloy films. Extensive new measurements on sputtered films show that a commercial quality sputtering process produces a film with the same dependence of Curie temperature on x as previously reported for bulk samples of the same material. These measurements and parameters from the Renormalization Group theory for a Heisenberg ferromagnet, yield an estimate for Tc of 1.16 ± 0.01 K when x - 0.004, consistent with previously reported bulk results.

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