Linearization of highly-efficient monolithic class e SiGe power amplifiers with Envelope-Tracking (ET) and Envelope-Elimination-and-Restoration (EER) at 900MHz

Donald Y.C. Lie, J. D. Popp, F. Wang, D. Kimball, L. E. Larson

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

The linearization of highly efficient monolithic SiGe Class E power amplifiers (PAs) using both Envelope-Tracking (ET) and Envelope-Elimination-and- Restoration (EER) techniques has been studied at 900MHz. Without applying any linearization, the fully-integrated SiGe PAs achieve power-added efficiency (PAE) of 66% with no offchip matching. The overall PAE of an ET-linearized PA system is 45% at an output power of 2OdBm for an 881MHz EDGE (Enhanced Data Rate for GSM Evolution) modulated signal. The ET-linearized PAs pass the stringent EDGE transmit spectrum mask, but the EER-linearized PAs do not. The PAE of the ET system is expected to reach -50% with further efficiency improvement on the envelope amplifier.

Original languageEnglish
Title of host publication2007 IEEE Dallas/CAS Workshop on System-on-Chip (SoC)
Subtitle of host publicationDesign, Applications, Integration, and Software, DCAS-07
Pages39-42
Number of pages4
DOIs
StatePublished - 2007
Event2007 IEEE Dallas/CAS Workshop on System-on-Chip (SoC): Design, Applications, Integration, and Software, DCAS-07 - Dallas, TX, United States
Duration: Nov 15 2007Nov 16 2007

Publication series

Name2007 IEEE Dallas/CAS Workshop on System-on-Chip (SoC): Design, Applications, Integration, and Software, DCAS-07

Conference

Conference2007 IEEE Dallas/CAS Workshop on System-on-Chip (SoC): Design, Applications, Integration, and Software, DCAS-07
CountryUnited States
CityDallas, TX
Period11/15/0711/16/07

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