Abstract
Unexpectedly large isotope effects have been reported for the vibrational lifetimes of the H-C stretch mode of the CH2* defect in Si and the asymmetric stretch of interstitial O in Si as well. First-principles theory can explain these effects. The results imply that defects trap phonons for lengths of time that depend on the defect and sometimes on its isotopic composition. Some consequences of phonon trapping are discussed.
Original language | English |
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Title of host publication | Gettering and Defect Engineering in Semiconductor Technology XV |
Publisher | Trans Tech Publications Ltd |
Pages | 209-212 |
Number of pages | 4 |
ISBN (Print) | 9783037858240 |
DOIs | |
State | Published - 2014 |
Event | 15th Gettering and Defect Engineering in Semiconductor Technology, GADEST 2013 - Oxford, United Kingdom Duration: Sep 22 2013 → Sep 27 2013 |
Publication series
Name | Solid State Phenomena |
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Volume | 205-206 |
ISSN (Print) | 1012-0394 |
Conference
Conference | 15th Gettering and Defect Engineering in Semiconductor Technology, GADEST 2013 |
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Country/Territory | United Kingdom |
City | Oxford |
Period | 09/22/13 → 09/27/13 |
Keywords
- Isotope effects
- Phonon trapping
- Silicon