Investigation of unique broadband nonlinear RF response of electronic devices

Ashish Mishra, Chen Song, Wenyao Xu, Changzhi Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Modern electronic devices with the same part number fabricated by the same company show different nonlinear responses when probed by broadband radio frequency (RF) signals. The difference in the response is primarily due to process variation during device fabrication. In this paper, the individual variation of device intermodulation response is studied. Experiments are performed to demonstrate that devices with the same design and layout can be differentiated based on their broadband intermodulation responses. This makes it possible to use RF technology to remotely identify and authenticate electronic devices.

Original languageEnglish
Title of host publicationRWS 2018 - Proceedings
Subtitle of host publication2018 IEEE Radio and Wireless Symposium
PublisherIEEE Computer Society
Pages281-283
Number of pages3
ISBN (Electronic)9781538607091
DOIs
StatePublished - Feb 28 2018
Event2018 IEEE Radio and Wireless Symposium, RWS 2018 - Anaheim, United States
Duration: Jan 14 2018Jan 17 2018

Publication series

NameIEEE Radio and Wireless Symposium, RWS
Volume2018-January
ISSN (Print)2164-2958
ISSN (Electronic)2164-2974

Conference

Conference2018 IEEE Radio and Wireless Symposium, RWS 2018
CountryUnited States
CityAnaheim
Period01/14/1801/17/18

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Keywords

  • Broadband
  • Intermodulation
  • Nonlinear measurement
  • Process variation
  • Third order intermodulation

Cite this

Mishra, A., Song, C., Xu, W., & Li, C. (2018). Investigation of unique broadband nonlinear RF response of electronic devices. In RWS 2018 - Proceedings: 2018 IEEE Radio and Wireless Symposium (pp. 281-283). (IEEE Radio and Wireless Symposium, RWS; Vol. 2018-January). IEEE Computer Society. https://doi.org/10.1109/RWS.2018.8305010