Influence of defects on structural and electrical properties of VO2 thin films

Changhong Chen, Yong Zhao, Xuan Pan, Vladimir Kuryatkov, Ayrton Bernussi, Mark Holtz, Zhaoyang Fan

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)023707
JournalJournal of Applied Physics
StatePublished - Jul 22 2011

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