Influence of defects on structural and electrical properties of VO2 thin films

Changhong Chen, Yong Zhao, Xuan Pan, Vladimir Kuryatkov, Ayrton Bernussi, Mark Holtz, Zhaoyang Fan

Research output: Contribution to journal › Article › peer-review

Cite this

@article{c5bf85aeaafe487aa52aac472cd77f19,

title = "Influence of defects on structural and electrical properties of VO2 thin films",

author = "Changhong Chen and Yong Zhao and Xuan Pan and Vladimir Kuryatkov and Ayrton Bernussi and Mark Holtz and Zhaoyang Fan",

year = "2011",

month = jul,

day = "22",

language = "English",

pages = "023707",

journal = "Journal of Applied Physics",

publisher = "American Institute of Physics",

}