Inducing dendrite formation using an atomic force microscope tip

Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary.