Inducing dendrite formation using an atomic force microscope tip

Gengxin Zhang, Brandon L. Weeks

Research output: Contribution to journalArticle

15 Scopus citations

Abstract

Atomic force microscope (AFM) tip-induced nucleation, and dendrite growth of vapor deposited PETN films on Si (100) have been investigated at room temperature. The AFM tip induces a change from smooth and flat morphology to islands and dendrites, which is owing to the lowering and vanishing of 2-D nucleation barrier at the tip contact area; this action gives rise to the formation of large islands in the scanned area and dendrite growth along the scanning boundary.

Original languageEnglish
Pages (from-to)228-231
Number of pages4
JournalScanning
Volume30
Issue number3
DOIs
StatePublished - May 2008

Keywords

  • AFM/other scanned probe microscopes
  • Explosives

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