In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression (vol 17, pg 824, 2020). (Correction)

Owen Brazil, Mithun Chowdhury, Heedong Yoon, Gregory McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica

Research output: Other contributionpeer-review

Original languageEnglish
Volume35
StatePublished - 2020

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