In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression

Owen Brazil, Mithun Chowdhury, Heedong Yoon, Gregory McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)644-653
JournalJournal of Materials Research
StatePublished - 2020

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