Original language | English |
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Pages (from-to) | 644-653 |
Journal | Journal of Materials Research |
State | Published - 2020 |
In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression
Owen Brazil, Mithun Chowdhury, Heedong Yoon, Gregory McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica
Research output: Contribution to journal › Article › peer-review