In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression

Owen Brazil, Mithun Chowdhury, Heedong Yoon, Gregory McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	644-653
Journal	Journal of Materials Research
State	Published - 2020

Cite this

@article{3fdf31d7a16c4614aa3b15fa15e38444,

title = "In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression",

author = "Owen Brazil and Mithun Chowdhury and Heedong Yoon and Gregory McKenna and Oliver, {Warren C.} and Jason Kilpatrick and Pethica, {John B.}",

year = "2020",

language = "English",

pages = "644--653",

journal = "Journal of Materials Research",

issn = "0884-2914",

}

TY - JOUR

T1 - In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression

AU - Brazil, Owen

AU - Chowdhury, Mithun

AU - Yoon, Heedong

AU - McKenna, Gregory

AU - Oliver, Warren C.

AU - Kilpatrick, Jason

AU - Pethica, John B.

PY - 2020

Y1 - 2020

M3 - Article

SP - 644

EP - 653

JO - Journal of Materials Research

JF - Journal of Materials Research

SN - 0884-2914

ER -