Electron injection and the subsequent formation of a trap filled region leads to premature device failure in an opposed contact, EL2/carbon compensated GaAs photoconductive switch, made through the liquid encapsulated Czochralski process. Due to the electrostatic properties associated with a n+/semi-insulating junction, the introduction of a n+ region next to the cathode suppresses electron injection until higher bias. The doping level, length, and the thickness of the high n+ region are some of the parameters that affect hold-off characteristics. Extending the length of the n+ region well beyond the cathode does not increase the hold-off voltage but confines current flow to a narrow strip, which may trigger local heating burnout. Suppression of the effects of the EL2 traps at the n+/SI interface also does not improve the hold-off characteristics. Opposed contact switches, made from intrinsic GaAs have the characteristics of `relaxation' semiconductors. The injection of minority carrier results in initial recombination and the formation of a large number of recombination regions may contribute to switching delays and jitters.
|Number of pages||4|
|State||Published - 1999|
|Event||12th IEEE International Pulsed Power Conference - Monterey, CA, USA|
Duration: Jun 27 1999 → Jun 30 1999
|Conference||12th IEEE International Pulsed Power Conference|
|City||Monterey, CA, USA|
|Period||06/27/99 → 06/30/99|