Imaging of crystal growth-induced fine surface features in zeolite A by atomic force microscopy

Seyda Dumrul, Stephane Bazzana, Juliusz Warzywoda, Ronald R. Biederman, Albert Sacco

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

Atomic force microscopy was used to examine the crystal growth-induced fine surface features on the {100} faces of zeolite A. Features reported previously (terraces with ledges ~1.2 nm in height, and small pyramidal structures composed of layers with thickness of ~1.2 nm) as well as features not reported previously (polygonized growth spirals with step height of ~1.2 nm) were observed. These features suggest that the layer growth of zeolite A can occur by both a "perfect" crystal two-dimensional nucleation mechanism, and by an "imperfect" crystal spiral growth mechanism. The origin of the observed small pyramidal structures and growth spirals as well as the mechanisms of their formation are hypothesized.

Original languageEnglish
Pages (from-to)79-88
Number of pages10
JournalMicroporous and Mesoporous Materials
Volume54
Issue number1-2
DOIs
StatePublished - Jul 1 2002

Keywords

  • Atomic force microscopy
  • Crystal growth
  • Surface structure
  • Topography
  • Zeolite A

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