Image paradigm for semiconductor defect data reduction

Jr Kenneth W. Tobin, Shaun S. Gleason, Thomas P. Karnowski, Hamed Sari-Sarraf, Marylyn H. Bennett

Research output: Contribution to conference › Paper

Original languageEnglish
StatePublished - 1996

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    Kenneth W. Tobin, J., Gleason, S. S., Karnowski, T. P., Sari-Sarraf, H., & Bennett, M. H. (1996). Image paradigm for semiconductor defect data reduction.