How to do RF-BiST with virtually no extra circuits for RF-SoC products?

Dallas Webster, Jerry Lopez, Donald Y.C. Lie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

This paper describes novel RF Built-in Self Test (RF-BiST) and RF Built-in-Self-Calibration (RF-BiSC) techniques that can test the performance of RF SoC's using on-chip resources as both test stimuli and response analyzers. Our RF-BiST approach is to fully utilize existing on-chip circuitry to prevent adding extra die area, while remaining capable of performing various RF-SoC self-tests. Successful RF-BiST examples include internally measuring RF oscillators with on-chip digital signals from an All-Digital Phase Locked Loop (ADPLL). Other RF-BiST examples cover various contributors to Error Vector Magnitude (EVM) such as gain, linearity, and phase noise. Functional RF-BiSTs, such as loop-back methods, can be verified from GSM/EDGE to WLAN SoCs through good correlation with comparable external tests. Additionally, RF-BiST/ BiSC with on-chip digital controllers and compensation networks can help drastically reduce the cost of phase and amplitude calibration and the deployment time with improved uniformity for phased-array RADARs, benefiting both future military and commercial RADAR systems considerably.

Original languageEnglish
Title of host publication2010 IEEE International 53rd Midwest Symposium on Circuits and Systems, MWSCAS 2010
Pages469-472
Number of pages4
DOIs
StatePublished - 2010
Event53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010 - Seattle, WA, United States
Duration: Aug 1 2010Aug 4 2010

Publication series

NameMidwest Symposium on Circuits and Systems
ISSN (Print)1548-3746

Conference

Conference53rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2010
CountryUnited States
CitySeattle, WA
Period08/1/1008/4/10

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  • Cite this

    Webster, D., Lopez, J., & Lie, D. Y. C. (2010). How to do RF-BiST with virtually no extra circuits for RF-SoC products? In 2010 IEEE International 53rd Midwest Symposium on Circuits and Systems, MWSCAS 2010 (pp. 469-472). [5548735] (Midwest Symposium on Circuits and Systems). https://doi.org/10.1109/MWSCAS.2010.5548735