TY - GEN
T1 - Highly efficient 5G linear power amplifiers (PA) design challenges
AU - Lie, D. Y.C.
AU - Mayeda, J. C.
AU - Lopez, J.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/6/5
Y1 - 2017/6/5
N2 - The incoming 5G revolution will dramatically increase the design complexity for handsets and communication infrastructures, demanding the RFIC and ASIC chipsets designers, network and system components vendors and telecom operators to provide viable 5G E2E (End-to-End) products and solutions before A.D. 2020. The broadband modulation bandwidth for RF transmitters (i.e., 250 MHz to above 1 GHz), stringent linearity, and power efficiency requirements at the cm-Wave/mm-Wave 5G frequencies will make it particularly challenging for highly efficient linear 5G power amplifier (PA) design. We will briefly address two major design challenges and solutions for 5G PA design here, namely the device technology choices and efficiency enhancement techniques.
AB - The incoming 5G revolution will dramatically increase the design complexity for handsets and communication infrastructures, demanding the RFIC and ASIC chipsets designers, network and system components vendors and telecom operators to provide viable 5G E2E (End-to-End) products and solutions before A.D. 2020. The broadband modulation bandwidth for RF transmitters (i.e., 250 MHz to above 1 GHz), stringent linearity, and power efficiency requirements at the cm-Wave/mm-Wave 5G frequencies will make it particularly challenging for highly efficient linear 5G power amplifier (PA) design. We will briefly address two major design challenges and solutions for 5G PA design here, namely the device technology choices and efficiency enhancement techniques.
UR - http://www.scopus.com/inward/record.url?scp=85021411792&partnerID=8YFLogxK
U2 - 10.1109/VLSI-DAT.2017.7939653
DO - 10.1109/VLSI-DAT.2017.7939653
M3 - Conference contribution
AN - SCOPUS:85021411792
T3 - 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
BT - 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
Y2 - 24 April 2017 through 27 April 2017
ER -