@inproceedings{8911d76a2b5849a9864acbf38d933f3c,
title = "High voltage testing of capacitors",
abstract = "Three different types of capacitors have been tested to determine maximum usable high voltage. The capacitor testing was performed in the dynamic mode. The voltage rise varied from 200 to 400 V/sec. Disc ceramic and thin film capacitors of different value and different nominal voltages were tested. Experiments have shown that the breakdown voltage for all types of the capacitors tested is about ten times more than the nominal voltage of the capacitors. Data are given for the limiting high voltage for each kind of the capacitors. Experiments have shown that the mechanisms for the destruction of each type of capacitors have specific features.",
author = "Shkuratov, {S. I.} and Talantsev, {E. F.} and Kristiansen, {M. L.} and J. Dickens",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 ; Conference date: 17-06-2001 Through 22-06-2001",
year = "2001",
doi = "10.1109/PPPS.2001.1001859",
language = "English",
series = "PPPS 2001 - Pulsed Power Plasma Science 2001",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1559--1562",
editor = "Robert Reinovsky and Mark Newton",
booktitle = "PPPS 2001 - Pulsed Power Plasma Science 2001",
}