High voltage testing of capacitors

S. I. Shkuratov, E. F. Talantsev, M. L. Kristiansen, J. Dickens

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Three different types of capacitors have been tested to determine maximum usable high voltage. The capacitor testing was performed in the dynamic mode. The voltage rise varied from 200 to 400 V/sec. Disc ceramic and thin film capacitors of different value and different nominal voltages were tested. Experiments have shown that the breakdown voltage for all types of the capacitors tested is about ten times more than the nominal voltage of the capacitors. Data are given for the limiting high voltage for each kind of the capacitors. Experiments have shown that the mechanisms for the destruction of each type of capacitors have specific features.

Original languageEnglish
Title of host publicationPPPS 2001 - Pulsed Power Plasma Science 2001
EditorsRobert Reinovsky, Mark Newton
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1559-1562
Number of pages4
ISBN (Electronic)0780371208, 9780780371200
DOIs
StatePublished - 2001
Event28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, United States
Duration: Jun 17 2001Jun 22 2001

Publication series

NamePPPS 2001 - Pulsed Power Plasma Science 2001
Volume2

Conference

Conference28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
CountryUnited States
CityLas Vegas
Period06/17/0106/22/01

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    Shkuratov, S. I., Talantsev, E. F., Kristiansen, M. L., & Dickens, J. (2001). High voltage testing of capacitors. In R. Reinovsky, & M. Newton (Eds.), PPPS 2001 - Pulsed Power Plasma Science 2001 (pp. 1559-1562). [1001859] (PPPS 2001 - Pulsed Power Plasma Science 2001; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPPS.2001.1001859