High-pressure dielectric behavior of polycrystalline CaMoO4: The role of grain boundaries

Tianru Qin, Qinglin Wang, Donghui Yue, Wenshu Shen, Yalan Yan, Yonghao Han, Yanzhang Ma, Chunxiao Gao

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1-6
JournalDefault journal
StatePublished - 2018

Fingerprint Dive into the research topics of 'High-pressure dielectric behavior of polycrystalline CaMoO4: The role of grain boundaries'. Together they form a unique fingerprint.

Cite this