High power water switches: Postbreakdown phenomena and dielectric recovery

Shu Xiao; J. Kolb; S. Kono; S. Katsuki; R. P. Joshi; M. Laroussi; K. H. Schoenbach

doi:10.1109/TDEI.2004.1324350

High power water switches: Postbreakdown phenomena and dielectric recovery

Shu Xiao, J. Kolb, S. Kono, S. Katsuki, R. P. Joshi, M. Laroussi, K. H. Schoenbach

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

Abstract

The physical processes following the electrical breakdown of water between planar and hemispherical electrodes separated by a sub-millimeter gap have been studied using electrical and optical diagnostics. The expanding plasma column after breakdown generates first shockwaves and at a later stage a vapor bubble which expands for about 200 μs and then decays with a time constant of 1 ms. The bubble decay time determines the dielectric recovery of the switch as has been shown with pulse-probe experiments.

Original language	English
Pages (from-to)	604-612
Number of pages	9
Journal	IEEE Transactions on Dielectrics and Electrical Insulation
Volume	11
Issue number	4
DOIs	https://doi.org/10.1109/TDEI.2004.1324350
State	Published - Aug 2004

Keywords

Dielectric recovery
Electrical breakdown
Pulsed power switching
Shock-waves
Water

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10.1109/TDEI.2004.1324350

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title = "High power water switches: Postbreakdown phenomena and dielectric recovery",

abstract = "The physical processes following the electrical breakdown of water between planar and hemispherical electrodes separated by a sub-millimeter gap have been studied using electrical and optical diagnostics. The expanding plasma column after breakdown generates first shockwaves and at a later stage a vapor bubble which expands for about 200 μs and then decays with a time constant of 1 ms. The bubble decay time determines the dielectric recovery of the switch as has been shown with pulse-probe experiments.",

keywords = "Dielectric recovery, Electrical breakdown, Pulsed power switching, Shock-waves, Water",

author = "Shu Xiao and J. Kolb and S. Kono and S. Katsuki and Joshi, {R. P.} and M. Laroussi and Schoenbach, {K. H.}",

note = "Funding Information: This research has been supported by an AFOSR/DOD MURI grant on Compact, Portable Pulsed Power, administered through the University of New Mexico.",

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T1 - High power water switches

T2 - Postbreakdown phenomena and dielectric recovery

AU - Xiao, Shu

AU - Kolb, J.

AU - Kono, S.

AU - Katsuki, S.

AU - Joshi, R. P.

AU - Laroussi, M.

AU - Schoenbach, K. H.

N1 - Funding Information: This research has been supported by an AFOSR/DOD MURI grant on Compact, Portable Pulsed Power, administered through the University of New Mexico.

PY - 2004/8

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N2 - The physical processes following the electrical breakdown of water between planar and hemispherical electrodes separated by a sub-millimeter gap have been studied using electrical and optical diagnostics. The expanding plasma column after breakdown generates first shockwaves and at a later stage a vapor bubble which expands for about 200 μs and then decays with a time constant of 1 ms. The bubble decay time determines the dielectric recovery of the switch as has been shown with pulse-probe experiments.

AB - The physical processes following the electrical breakdown of water between planar and hemispherical electrodes separated by a sub-millimeter gap have been studied using electrical and optical diagnostics. The expanding plasma column after breakdown generates first shockwaves and at a later stage a vapor bubble which expands for about 200 μs and then decays with a time constant of 1 ms. The bubble decay time determines the dielectric recovery of the switch as has been shown with pulse-probe experiments.

KW - Dielectric recovery

KW - Electrical breakdown

KW - Pulsed power switching

KW - Shock-waves

KW - Water

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EP - 612

JO - IEEE Transactions on Dielectrics and Electrical Insulation

JF - IEEE Transactions on Dielectrics and Electrical Insulation

SN - 1070-9878

IS - 4

ER -

High power water switches: Postbreakdown phenomena and dielectric recovery

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