Hard-Switch Stressing of Vertical-channel implanted-Gate SiC JFETs

Stephen Bayne, Kevin Lawson, G Alvarez, Victor Veliadis, H Ha, D Urciuoli, Skip Scozzie

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)86-88
JournalIEEE Electron Device letters
StatePublished - Nov 2011

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