Hard-switch stressing of vertical-channel implanted-gate SiC JFETs

K. Lawson, G. Alvarez, S. B. Bayne, V. Veliadis, H. C. Ha, D. Urciuoli, N. El-Hinnawy, P. Borodulin, C. Scozzie

Research output: Contribution to journalArticle

20 Scopus citations

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Chemical Compounds

Engineering & Materials Science