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Hard-switch stressing of vertical-channel implanted-gate SiC JFETs
K. Lawson, G. Alvarez, S. B. Bayne, V. Veliadis, H. C. Ha, D. Urciuoli, N. El-Hinnawy, P. Borodulin, C. Scozzie
Research output: Contribution to journal › Article › peer-review
20
Scopus
citations