TY - GEN
T1 - Growth of III-nitride quantum structures for device applications
AU - Nikishin, Sergey
AU - Holtz, Mark
PY - 2010
Y1 - 2010
N2 - Using GSMBE with ammonia on (0001) sapphire substrates, AlN/AlGaN nanostructured short period superlattices (SPSLs), with respective well and barrier thickness from 0.5 to 1 nm and from 0.75 to 1.5 nm, have been shown to have energy gaps in the deep UV suitable for light emitting diodes (LEDs) and photodetectors (PDs) operating down to 247 nm. Performance of LEDs and PDs is limited by factors including efficiency of radiative recombination and absorption in the active region and electrical resistivity of p-type wide bandgap SPSLs. Based on MOVPE, we have used selective area epitixy (SAE) to grow InGaN/GaN quantum structures. By patterning SiO2 hard mask materials on planar sapphire substrates, we have grown various shapes including pyramidal stripes with InxGa1-xN multiple quantum wells. The structures at the apex are found to have very high In content with corresponding optical emission in the green wavelength range and excellent uniformity.
AB - Using GSMBE with ammonia on (0001) sapphire substrates, AlN/AlGaN nanostructured short period superlattices (SPSLs), with respective well and barrier thickness from 0.5 to 1 nm and from 0.75 to 1.5 nm, have been shown to have energy gaps in the deep UV suitable for light emitting diodes (LEDs) and photodetectors (PDs) operating down to 247 nm. Performance of LEDs and PDs is limited by factors including efficiency of radiative recombination and absorption in the active region and electrical resistivity of p-type wide bandgap SPSLs. Based on MOVPE, we have used selective area epitixy (SAE) to grow InGaN/GaN quantum structures. By patterning SiO2 hard mask materials on planar sapphire substrates, we have grown various shapes including pyramidal stripes with InxGa1-xN multiple quantum wells. The structures at the apex are found to have very high In content with corresponding optical emission in the green wavelength range and excellent uniformity.
UR - http://www.scopus.com/inward/record.url?scp=79951818101&partnerID=8YFLogxK
U2 - 10.1109/NANO.2010.5698066
DO - 10.1109/NANO.2010.5698066
M3 - Conference contribution
AN - SCOPUS:79951818101
SN - 9781424470334
T3 - 2010 10th IEEE Conference on Nanotechnology, NANO 2010
SP - 31
EP - 36
BT - 2010 10th IEEE Conference on Nanotechnology, NANO 2010
Y2 - 17 August 2010 through 20 August 2010
ER -