Further studies on T* integral under plane stress crack growth

Y. Omori; H. Okada; L. Ma; S. N. Atluri; A. S. Kobayashi; P. Tan

Further studies on T^* integral under plane stress crack growth

Y. Omori, H. Okada, L. Ma, S. N. Atluri, A. S. Kobayashi, P. Tan

Mechanical Engineering

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

T^*_ε-integral values associated with stable crack growth in thin 2024-T3 aluminum single edge notched (SEN) and central notched (CN) specimens were computed directly from the crack tip displacement field obtained by moire interferometry. These results agreed with the T*_ε obtained from an elastic-plastic finite element (FE) simulation of the stable crack growth in a SEN specimen. These T*_ε variations with stable crack growth also agreed with those determined experimentally in the CN specimens thus suggesting that for a given Γ_ε, T^*_ε can be used as a stable crack growth and a ductile fracture criteria.

Original language	English
Pages	511-517
Number of pages	7
State	Published - 1996
Event	Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control - Fukuoka, Jpn Duration: Jun 3 1996 → Jun 5 1996

Conference

Conference	Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control
City	Fukuoka, Jpn
Period	06/3/96 → 06/5/96

Cite this

@conference{2e6b327f86024bc4947d7146f6a8acf7,

title = "Further studies on T* integral under plane stress crack growth",

abstract = "T*ε-integral values associated with stable crack growth in thin 2024-T3 aluminum single edge notched (SEN) and central notched (CN) specimens were computed directly from the crack tip displacement field obtained by moire interferometry. These results agreed with the T*ε obtained from an elastic-plastic finite element (FE) simulation of the stable crack growth in a SEN specimen. These T*ε variations with stable crack growth also agreed with those determined experimentally in the CN specimens thus suggesting that for a given Γε, T*ε can be used as a stable crack growth and a ductile fracture criteria.",

author = "Y. Omori and H. Okada and L. Ma and Atluri, {S. N.} and Kobayashi, {A. S.} and P. Tan",

year = "1996",

language = "English",

pages = "511--517",

note = "Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control ; Conference date: 03-06-1996 Through 05-06-1996",

}

TY - CONF

T1 - Further studies on T* integral under plane stress crack growth

AU - Omori, Y.

AU - Okada, H.

AU - Ma, L.

AU - Atluri, S. N.

AU - Kobayashi, A. S.

AU - Tan, P.

PY - 1996

Y1 - 1996

N2 - T*ε-integral values associated with stable crack growth in thin 2024-T3 aluminum single edge notched (SEN) and central notched (CN) specimens were computed directly from the crack tip displacement field obtained by moire interferometry. These results agreed with the T*ε obtained from an elastic-plastic finite element (FE) simulation of the stable crack growth in a SEN specimen. These T*ε variations with stable crack growth also agreed with those determined experimentally in the CN specimens thus suggesting that for a given Γε, T*ε can be used as a stable crack growth and a ductile fracture criteria.

AB - T*ε-integral values associated with stable crack growth in thin 2024-T3 aluminum single edge notched (SEN) and central notched (CN) specimens were computed directly from the crack tip displacement field obtained by moire interferometry. These results agreed with the T*ε obtained from an elastic-plastic finite element (FE) simulation of the stable crack growth in a SEN specimen. These T*ε variations with stable crack growth also agreed with those determined experimentally in the CN specimens thus suggesting that for a given Γε, T*ε can be used as a stable crack growth and a ductile fracture criteria.

UR - http://www.scopus.com/inward/record.url?scp=0029715889&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0029715889

SP - 511

EP - 517

T2 - Proceedings of the 1996 4th International Conference on Computer-Aided Assessment and Control

Y2 - 3 June 1996 through 5 June 1996

ER -

Further studies on T^* integral under plane stress crack growth

Abstract

Conference

Other files and links

Fingerprint

Cite this