Frequency-scanned deep-level transient spectroscopy

P. M. Henry; J. M. Meese; J. W. Farmer; C. D. Lamp

doi:10.1063/1.334753

Frequency-scanned deep-level transient spectroscopy

P. M. Henry, J. M. Meese, J. W. Farmer, C. D. Lamp

Physics

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26 Scopus citations

Abstract

The output signal in a deep-level transient spectroscopy experiment is a function of both the rate-window settings and sample temperature. Usually, the rate window is held fixed and the temperature scanned to produce the deep-level spectrum. We will demonstrate that a deep-level spectrum can also be obtained by fixing the temperature and scanning the rate window.

Original language	English
Pages (from-to)	628-630
Number of pages	3
Journal	Journal of Applied Physics
Volume	57
Issue number	2
DOIs	https://doi.org/10.1063/1.334753
State	Published - 1985

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title = "Frequency-scanned deep-level transient spectroscopy",

abstract = "The output signal in a deep-level transient spectroscopy experiment is a function of both the rate-window settings and sample temperature. Usually, the rate window is held fixed and the temperature scanned to produce the deep-level spectrum. We will demonstrate that a deep-level spectrum can also be obtained by fixing the temperature and scanning the rate window.",

author = "Henry, {P. M.} and Meese, {J. M.} and Farmer, {J. W.} and Lamp, {C. D.}",

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AU - Farmer, J. W.

AU - Lamp, C. D.

PY - 1985

Y1 - 1985

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AB - The output signal in a deep-level transient spectroscopy experiment is a function of both the rate-window settings and sample temperature. Usually, the rate window is held fixed and the temperature scanned to produce the deep-level spectrum. We will demonstrate that a deep-level spectrum can also be obtained by fixing the temperature and scanning the rate window.

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U2 - 10.1063/1.334753

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 2

ER -

Frequency-scanned deep-level transient spectroscopy

Abstract

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