Frequency-scanned deep-level transient spectroscopy

P. M. Henry, J. M. Meese, J. W. Farmer, C. D. Lamp

Research output: Contribution to journalArticlepeer-review

26 Scopus citations


The output signal in a deep-level transient spectroscopy experiment is a function of both the rate-window settings and sample temperature. Usually, the rate window is held fixed and the temperature scanned to produce the deep-level spectrum. We will demonstrate that a deep-level spectrum can also be obtained by fixing the temperature and scanning the rate window.

Original languageEnglish
Pages (from-to)628-630
Number of pages3
JournalJournal of Applied Physics
Issue number2
StatePublished - 1985


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