Fourier ptychographic microscopy using an infrared-emitting hemispherical digital condenser

Sanchari Sen, Ishtiaque Ahmed, Batool Aljubran, Ayrton A. Bernussi, Luis Grave De Peralta

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Fourier ptychographic microscopy is demonstrated in the near-infrared spectral range using a computer-controlled hemispherical digital condenser comprising multiple 940 nm wavelength light emitting diodes. This technique was used to image periodic patterned samples (photonic crystals). Experimental and simulated results using a phase retrieval algorithm were found to be in excellent correspondence. We show that for samples with a single period in each direction, the resolution of the obtained high-resolution near-infrared images is limited by the Rayleigh criteria.

Original languageEnglish
Pages (from-to)6421-6427
Number of pages7
JournalApplied Optics
Volume55
Issue number23
DOIs
StatePublished - Aug 10 2016

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