Abstract
Fourier ptychographic microscopy is demonstrated in the near-infrared spectral range using a computer-controlled hemispherical digital condenser comprising multiple 940 nm wavelength light emitting diodes. This technique was used to image periodic patterned samples (photonic crystals). Experimental and simulated results using a phase retrieval algorithm were found to be in excellent correspondence. We show that for samples with a single period in each direction, the resolution of the obtained high-resolution near-infrared images is limited by the Rayleigh criteria.
Original language | English |
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Pages (from-to) | 6421-6427 |
Number of pages | 7 |
Journal | Applied Optics |
Volume | 55 |
Issue number | 23 |
DOIs | |
State | Published - Aug 10 2016 |