Fourier plane imaging microscopy

Luis Grave De Peralta; Ayrton A. Bernussi

Fourier plane imaging microscopy

Luis Grave De Peralta, Ayrton A. Bernussi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Super-resolution images were obtained using a simple microscope formed by an ultrathin condenser and an objective lens. This was because the Fourier plane images carried more information about the object than real plane images do.

Original language	English
Title of host publication	2015 Conference on Lasers and Electro-Optics, CLEO 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781557529688
State	Published - Aug 10 2015
Event	Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: May 10 2015 → May 15 2015

Publication series

Name	Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume	2015-August

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2015
Country	United States
City	San Jose
Period	05/10/15 → 05/15/15

Keywords

Image resolution
Lenses
Microscopy
Optical diffraction
Optical microscopy
Optical surface waves
Surface waves

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Cite this

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title = "Fourier plane imaging microscopy",

abstract = "Super-resolution images were obtained using a simple microscope formed by an ultrathin condenser and an objective lens. This was because the Fourier plane images carried more information about the object than real plane images do.",

keywords = "Image resolution, Lenses, Microscopy, Optical diffraction, Optical microscopy, Optical surface waves, Surface waves",

author = "{De Peralta}, {Luis Grave} and Bernussi, {Ayrton A.}",

year = "2015",

month = aug,

day = "10",

language = "English",

series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",

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Fourier plane imaging microscopy. / De Peralta, Luis Grave ; Bernussi, Ayrton A.

2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7183593 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Fourier plane imaging microscopy

AU - De Peralta, Luis Grave

AU - Bernussi, Ayrton A.

PY - 2015/8/10

Y1 - 2015/8/10

N2 - Super-resolution images were obtained using a simple microscope formed by an ultrathin condenser and an objective lens. This was because the Fourier plane images carried more information about the object than real plane images do.

AB - Super-resolution images were obtained using a simple microscope formed by an ultrathin condenser and an objective lens. This was because the Fourier plane images carried more information about the object than real plane images do.

KW - Image resolution

KW - Lenses

KW - Microscopy

KW - Optical diffraction

KW - Optical microscopy

KW - Optical surface waves

KW - Surface waves

UR - http://www.scopus.com/inward/record.url?scp=84954053829&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84954053829

T3 - Conference on Lasers and Electro-Optics Europe - Technical Digest

BT - 2015 Conference on Lasers and Electro-Optics, CLEO 2015

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 10 May 2015 through 15 May 2015

ER -