Fourier plane imaging and illumination-direction-multiplexing using a rotating diffracting element for fourier ptychographic microscopy

Sueli Skinner-Ramos, Hira Farooq, Ayrton A. Bernussi, Luis Grave de Peralta

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

We demonstrate a practical method for imaging periodic structures with periods beyond the Rayleigh resolution limit of the imaging system employed. The sample was simultaneously illuminated from several directions using a combination of a source of collimated white-light, a diffracting element, and a microscope objective lens. By rotating the diffracting element, several pairs of real plane and Fourier plane images were obtained. A high-resolution image of the periodic structure was numerically reconstructed by processing the experimental images using the Fourier ptychographic algorithm. We used the Fourier plane imaging microscopy technique to approximate the initial optical disturbance in the phase-recovery algorithm.

Original languageEnglish
Pages (from-to)231-237
Number of pages7
JournalOptics Communications
Volume427
DOIs
StatePublished - Nov 15 2018

Keywords

  • Illumination design
  • Image formation theory
  • Light-emitting diodes
  • Microscopy

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