Formative measurement: A critical perspective

Roy D. Howell; Einar Breivik; James B. Wilcox

doi:10.1145/2544415.2544418

Formative measurement: A critical perspective

Roy D. Howell, Einar Breivik, James B. Wilcox

Business Administration

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

The past five years have witnessed a plethora of articles on the topic of formative measurement, both in the IS area and in other disciplines. This work can best be described as divergent and often contradictory. In this paper we review the issues surrounding formative measurement and attempt to delineate areas of agreement and to clarify points of disagreement regarding problems with formative measurement and proposed solutions. We provide six recommendations regarding the future use of formative measurement in IS research.

Original language	English
Pages (from-to)	44-55
Number of pages	12
Journal	Data Base for Advances in Information Systems
Volume	44
Issue number	4
DOIs	https://doi.org/10.1145/2544415.2544418
State	Published - Nov 2013

Keywords

Constructs
Formative Measurement
PLS
Reflective Measurement
SEM

Access to Document

10.1145/2544415.2544418

Cite this

@article{efe54b6d8ac54a458dae13b00e34248a,

title = "Formative measurement: A critical perspective",

abstract = "The past five years have witnessed a plethora of articles on the topic of formative measurement, both in the IS area and in other disciplines. This work can best be described as divergent and often contradictory. In this paper we review the issues surrounding formative measurement and attempt to delineate areas of agreement and to clarify points of disagreement regarding problems with formative measurement and proposed solutions. We provide six recommendations regarding the future use of formative measurement in IS research.",

keywords = "Constructs, Formative Measurement, PLS, Reflective Measurement, SEM",

author = "Howell, {Roy D.} and Einar Breivik and Wilcox, {James B.}",

year = "2013",

month = nov,

doi = "10.1145/2544415.2544418",

language = "English",

volume = "44",

pages = "44--55",

journal = "ACM SIGMIS Database",

issn = "0095-0033",

number = "4",

}

TY - JOUR

T1 - Formative measurement

T2 - A critical perspective

AU - Howell, Roy D.

AU - Breivik, Einar

AU - Wilcox, James B.

PY - 2013/11

Y1 - 2013/11

N2 - The past five years have witnessed a plethora of articles on the topic of formative measurement, both in the IS area and in other disciplines. This work can best be described as divergent and often contradictory. In this paper we review the issues surrounding formative measurement and attempt to delineate areas of agreement and to clarify points of disagreement regarding problems with formative measurement and proposed solutions. We provide six recommendations regarding the future use of formative measurement in IS research.

AB - The past five years have witnessed a plethora of articles on the topic of formative measurement, both in the IS area and in other disciplines. This work can best be described as divergent and often contradictory. In this paper we review the issues surrounding formative measurement and attempt to delineate areas of agreement and to clarify points of disagreement regarding problems with formative measurement and proposed solutions. We provide six recommendations regarding the future use of formative measurement in IS research.

KW - Constructs

KW - Formative Measurement

KW - PLS

KW - Reflective Measurement

KW - SEM

UR - http://www.scopus.com/inward/record.url?scp=84888600545&partnerID=8YFLogxK

U2 - 10.1145/2544415.2544418

DO - 10.1145/2544415.2544418

M3 - Article

AN - SCOPUS:84888600545

SN - 0095-0033

VL - 44

SP - 44

EP - 55

JO - ACM SIGMIS Database

JF - ACM SIGMIS Database

IS - 4

ER -

Formative measurement: A critical perspective

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this