Finite element analysis of resistivity measurement with van der Pauw method in a diamond anvil cell

Xiaowei Huang, Chunxiao Gao, Yonghao Han, Ming Li, Chunyuan He, Aimin Hao, Dongmei Zhang, Cuiling Yu, Guangtian Zou, Yanzhang Ma

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Using finite element analysis, the authors studied the steady current field distribution under the configuration of van der Pauw method [L. J. van der Pauw, Philips Tech. Rev. 20, 220 (1958)] for resistivity measurement in a diamond anvil cell. Based on the theoretical analysis, the authors obtained the theoretical accuracy curve of the van der Pauw method. This method provides accurate determination of sample resistivity when the ratio of sample thickness to its diameter is less than 0.45. They found that the contact area between electrode and sample is a key factor in the resistivity measurement accuracy and its size is dependent on the sample diameter for a given measurement accuracy.

Original languageEnglish
Article number242102
JournalApplied Physics Letters
Volume90
Issue number24
DOIs
StatePublished - 2007

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