Abstract
Field-induced electron transport in an InxGa1-xN (x ≅ 0.4) sample grown on GaN has been studied by subpicosecond Raman spectroscopy. Non-equilibrium electron distribution and electron drift velocity due to the presence of piezoelectric and spontaneous fields in the In xGa1-xN layer have been directly measured. The experimental results are compared with ensemble Monte Carlo calculations and reasonable agreements are obtained.
Original language | English |
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Pages (from-to) | S427-S429 |
Journal | Semiconductor Science and Technology |
Volume | 19 |
Issue number | 4 SPEC. ISS. |
DOIs | |
State | Published - Apr 2004 |