Failure analysis of 1200-V/150-A SiC MOSFET under repetitive pulsed overcurrent conditions

James Schrock, Bejoy N Pushpakaran, Argenis Bilbao, William Ray, Emily A Hirsch, Mitchell Kelley, Shad L Holt, Stephen Bayne

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1816–1821
JournalIEEE Transactions on Power Electronics
StatePublished - 2016

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