Failure Analysis of 1200-V / 150-A SiC MOSFET under Repetitive Pulsed Overcurrent Conditions

James Schrock, Bejoy Pushpakaran, Argenis Bilbao, William Ray, Emily Hirsch, Mitchell Kelley, Shad Holt, Stephen Bayne

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalIEEE Transactions on Power Electronics
StatePublished - Mar 2016

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