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Extraction of Safe Operating Area and long term reliability of experimental Silicon Carbide Super Gate Turn off Thyristors
S. Lacouture, J. A. Schrock, W. B. Ray, E. A. Hirsch, S. Bayne, M. Giesselmann, H. O'Brien, A. Ogunniyi, C. Scozzie
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
6
Scopus
citations