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Dive into the research topics of 'Extraction of Safe Operating Area and long term reliability of experimental Silicon Carbide Super Gate Turn off Thyristors'. Together they form a unique fingerprint.- Sort by
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S. Lacouture, J. A. Schrock, W. B. Ray, E. A. Hirsch, S. Bayne, M. Giesselmann, H. O'Brien, A. Ogunniyi, C. Scozzie
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review