Extraction of Safe Operating Area and long term reliability of experimental Silicon Carbide Super Gate Turn off Thyristors

S. Lacouture, J. A. Schrock, W. B. Ray, E. A. Hirsch, S. Bayne, M. Giesselmann, H. O'Brien, A. Ogunniyi, C. Scozzie

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

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Engineering & Materials Science