Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)

Owen Brazil, Johann P. De Silva, Mithun Chowdhury, Heedong Yoon, Gregory B. McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica, Graham L.W. Cross

Research output: Contribution to journalComment/debate

Abstract

In the original publication of this article [1], an erroneous repetitive sentence appeared in the abstract; it has since been removed.

Original languageEnglish
Pages (from-to)654
Number of pages1
JournalJournal of Materials Research
Volume35
Issue number6
DOIs
StatePublished - Mar 30 2020

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