Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)

Owen Brazil; Johann P. De Silva; Mithun Chowdhury; Heedong Yoon; Gregory B. McKenna; Warren C. Oliver; Jason Kilpatrick; John B. Pethica; Graham L.W. Cross

doi:10.1557/jmr.2020.67

Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)

Owen Brazil, Johann P. De Silva, Mithun Chowdhury, Heedong Yoon, Gregory B. McKenna, Warren C. Oliver, Jason Kilpatrick, John B. Pethica, Graham L.W. Cross

Chemical Engineering

Research output: Contribution to journal › Comment/debate

Abstract

In the original publication of this article [1], an erroneous repetitive sentence appeared in the abstract; it has since been removed.

Original language	English
Pages (from-to)	654
Number of pages	1
Journal	Journal of Materials Research
Volume	35
Issue number	6
DOIs	https://doi.org/10.1557/jmr.2020.67
State	Published - Mar 30 2020

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Brazil, O., De Silva, J. P., Chowdhury, M., Yoon, H., McKenna, G. B., Oliver, W. C., Kilpatrick, J., Pethica, J. B., & Cross, G. L. W. (2020). Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42). Journal of Materials Research, 35(6), 654. https://doi.org/10.1557/jmr.2020.67

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title = "Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)",

abstract = "In the original publication of this article [1], an erroneous repetitive sentence appeared in the abstract; it has since been removed.",

author = "Owen Brazil and {De Silva}, {Johann P.} and Mithun Chowdhury and Heedong Yoon and McKenna, {Gregory B.} and Oliver, {Warren C.} and Jason Kilpatrick and Pethica, {John B.} and Cross, {Graham L.W.}",

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Brazil, O, De Silva, JP, Chowdhury, M, Yoon, H, McKenna, GB, Oliver, WC, Kilpatrick, J, Pethica, JB & Cross, GLW 2020, 'Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)', Journal of Materials Research, vol. 35, no. 6, pp. 654. https://doi.org/10.1557/jmr.2020.67

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T2 - In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)

AU - Brazil, Owen

AU - De Silva, Johann P.

AU - Chowdhury, Mithun

AU - Yoon, Heedong

AU - McKenna, Gregory B.

AU - Oliver, Warren C.

AU - Kilpatrick, Jason

AU - Pethica, John B.

AU - Cross, Graham L.W.

PY - 2020/3/30

Y1 - 2020/3/30

N2 - In the original publication of this article [1], an erroneous repetitive sentence appeared in the abstract; it has since been removed.

AB - In the original publication of this article [1], an erroneous repetitive sentence appeared in the abstract; it has since been removed.

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U2 - 10.1557/jmr.2020.67

DO - 10.1557/jmr.2020.67

M3 - Comment/debate

AN - SCOPUS:85082553858

SN - 0884-2914

VL - 35

SP - 654

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 6

ER -

Erratum: In situmeasurement of bulk modulus and yield response of glassy thin films via confined layer compression (J. Mater. Res. (2020) DOI: 10.1557/jmr.2020.42)

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