Electrothermal Simulation-Based Comparison of 4H-SiC pin, Schottky, and JBS Diodes Under High Current Density Pulsed Operation

Bejoy N Pushpakaran, Stephen Bayne, Aderinto A Ogunniyi

Research output: Contribution to journalArticle

Original languageEnglish
JournalIEEE Transactions on Plasma Science
StatePublished - 2016

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