Electronics/avionics integrity: Definition, measurement and improvement

W. Kolarik, J. Rasty, M. Chen, Y. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The authors report on the results obtained from an extensive, three-fold research project: (1) to search the open quality and reliability literature for documented information relative to electronics/avionics integrity; (2) to interpret and evaluate the literature as to significant concepts, strategies, and tools appropriate for use in electronics/avionics product and process integrity efforts; and (3) to develop a list of critical findings and recommendations that will lead to significant progress in product integrity definition, measurement, modeling, and improvements. The research consisted of examining a broad range of trade journals, scientific journals, and technical reports, as well as face-to-face discussions with reliability professionals. Ten significant recommendations have been supported by the research work.

Original languageEnglish
Title of host publicationProceedings of the Annual Reliability and Maintainability Symposium
PublisherPubl by IEEE
Pages460-467
Number of pages8
ISBN (Print)0780305213
StatePublished - Mar 1992
EventProceedings of the 1992 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA
Duration: Jan 21 1992Jan 23 1992

Publication series

NameProceedings of the Annual Reliability and Maintainability Symposium
ISSN (Print)0149-144X

Conference

ConferenceProceedings of the 1992 Annual Reliability and Maintainability Symposium
CityLas Vegas, NV, USA
Period01/21/9201/23/92

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