Measurements of bias-dependent deflections and strain in EAPap, as well as water absorption were carried out. Model simulations have also been performed to probe the role of the various internal mechanisms. Our simulation predictions yield good agreement with the measured data on EAPap deflections. The modeling suggests that internal ion content and its migration, water absorption leading to a non-uniform permittivity, random variations in the transverse piezoelectric-coupling coefficient d31,i and the modulus of elasticity, all collectively contribute to the EAPap deflection electro-physics.
|Number of pages||4|
|Journal||Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|
|State||Published - 2007|
|Event||2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Vancouver, BC, Canada|
Duration: Oct 14 2007 → Oct 19 2007