TY - JOUR
T1 - Electro-thermal simulation studies for pulsed voltage induced energy absorption and potential failure in microstructured ZnO varistors
AU - Joshi, R. P.
AU - Zhao, G.
AU - Song, J.
AU - Lakdawala, V. K.
PY - 2007
Y1 - 2007
N2 - Time-dependent, two-dimensional simulations based on random Voronoi networks have been developed to study the internal heating and related breakdown effects in ZnO varistors in response to high-voltage pulsing. Our simulations allow for dynamic predictions of internal failures and the progression of hot-spots and thermal stresses. Results show that application of high voltage pulses can lead to the attainment of Bi2O3 melting temperatures in the grain boundaries and an accelerated progression towards failure. It is argued that reduction in grain size would help lower the maximum internal stress and enhance the hold-off voltage for a given sample size.
AB - Time-dependent, two-dimensional simulations based on random Voronoi networks have been developed to study the internal heating and related breakdown effects in ZnO varistors in response to high-voltage pulsing. Our simulations allow for dynamic predictions of internal failures and the progression of hot-spots and thermal stresses. Results show that application of high voltage pulses can lead to the attainment of Bi2O3 melting temperatures in the grain boundaries and an accelerated progression towards failure. It is argued that reduction in grain size would help lower the maximum internal stress and enhance the hold-off voltage for a given sample size.
UR - http://www.scopus.com/inward/record.url?scp=51249123755&partnerID=8YFLogxK
U2 - 10.1109/CEIDP.2007.4451506
DO - 10.1109/CEIDP.2007.4451506
M3 - Conference article
AN - SCOPUS:51249123755
SN - 0084-9162
SP - 631
EP - 634
JO - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
JF - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
M1 - 4451506
T2 - 2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Y2 - 14 October 2007 through 19 October 2007
ER -