Electro-thermal simulation studies for pulsed voltage induced energy absorption and potential failure in microstructured ZnO varistors

R. P. Joshi, G. Zhao, J. Song, V. K. Lakdawala

Research output: Contribution to journalConference article

Abstract

Time-dependent, two-dimensional simulations based on random Voronoi networks have been developed to study the internal heating and related breakdown effects in ZnO varistors in response to high-voltage pulsing. Our simulations allow for dynamic predictions of internal failures and the progression of hot-spots and thermal stresses. Results show that application of high voltage pulses can lead to the attainment of Bi2O3 melting temperatures in the grain boundaries and an accelerated progression towards failure. It is argued that reduction in grain size would help lower the maximum internal stress and enhance the hold-off voltage for a given sample size.

Original languageEnglish
Article number4451506
Pages (from-to)631-634
Number of pages4
JournalAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
DOIs
StatePublished - 2007
Event2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Vancouver, BC, Canada
Duration: Oct 14 2007Oct 19 2007

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