Abstract
We present direct measurements of the electric field distribution at the reflecting surface folding a grating of an arrayed-waveguide multiplexer. The field distribution obtained using different input channels of a device can be described by a single-Gaussian function. Grating and coupler-slab waveguide mode-field radii were determined directly. The field profile was used to model the transmission spectrum of the device. Excellent agreement was found between the measured and calculated spectra.
Original language | English |
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Pages (from-to) | 488-490 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 16 |
Issue number | 2 |
DOIs | |
State | Published - Feb 2004 |
Keywords
- Arrayed-waveguide grating (AWG)
- Characterization
- Multiplexers
- Optics
- Semiconductor lasers
- Waveguides