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Elastic strain in InGaN and AlGaN layers
M. F. Wu, Shude Yao, A. Vantomme, S. Hogg, G. Langouche, W. Van Der Stricht, K. Jacobs, I. Moerman, J. Li, G. Y. Zhang
Research output: Contribution to journal › Conference article › peer-review
15
Scopus
citations