Elastic contact model accounting for both asperity and substrate compliance with application to patterned media

Chang Dong Yeo, Andreas A. Polycarpou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An improved elastic contact stiffness model for a single asperity system is proposed to account for the effects of both bulk substrate and asperity deformations between two contacting surfaces. Depending upon the applied load, as well as the geometrical and physical properties of the asperity and bulk material, the bulk substrate can have a considerable contribution to the overall contact stiffness. Finite element analysis is performed to verify the proposed analytical model. The single asperity model is extended to rough surfaces in contact. The contact stiffness values from the proposed model are compared to those from the GW model. The proposed contact model can be directly relevant to analyze the contact behavior of modern patterned media.

Original languageEnglish
Title of host publication2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007
Pages1121-1122
Number of pages2
DOIs
StatePublished - 2008
Event2007 ASME/STLE International Joint Tribology Conference, IJTC 2007 - San Diego, CA, United States
Duration: Oct 22 2007Oct 24 2007

Publication series

Name2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007
VolumePART B

Conference

Conference2007 ASME/STLE International Joint Tribology Conference, IJTC 2007
CountryUnited States
CitySan Diego, CA
Period10/22/0710/24/07

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    Yeo, C. D., & Polycarpou, A. A. (2008). Elastic contact model accounting for both asperity and substrate compliance with application to patterned media. In 2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007 (pp. 1121-1122). (2007 Proceedings of the ASME/STLE International Joint Tribology Conference, IJTC 2007; Vol. PART B). https://doi.org/10.1115/IJTC2007-44503