Effect of passivation on III-nitride/silicon tandem solar cells

Huseyin Ekinci, Vladimir V. Kuryatkov, Iulian Gherasoiu, Sergey A. Nikishin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We have studied the impact of mesa sidewall passivation by SiO2 on characteristics of III-nitride/silicon tandem solar cells. These dual junction solar cells were fabricated from standard n-type Si (111) substrates with III-nitride epitaxial layers grown by plasma-assisted molecular beam epitaxy (PAMBE). Photovoltaic testing was experimentally carried out under a solar simulator before and after the 100nm-thick SiO2 passivation of these solar cell mesa side walls. We have found that the sidewall passivation improves the efficiency of these solar cells. The open-circuit voltage (VOC) increased from 1.45 to 1.53 V, the short-circuit current density (JSC) enhanced from 0.116 to 0.121 mA/cm2, the fill factor increased from 39.7 to 41.5% under the solar simulator illumination yielding 13.3% conversion efficiency improvement after passivation. Moreover, IPCE (the incident monochromatic photon to current conversion efficiency) also moderately increased by approximately 13% in the visible region after passivation.

Original languageEnglish
Title of host publicationELECO 2015 - 9th International Conference on Electrical and Electronics Engineering
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages148-151
Number of pages4
ISBN (Electronic)9786050107371
DOIs
StatePublished - Jan 28 2016
Event9th International Conference on Electrical and Electronics Engineering, ELECO 2015 - Bursa, Turkey
Duration: Nov 26 2015Nov 28 2015

Publication series

NameELECO 2015 - 9th International Conference on Electrical and Electronics Engineering

Conference

Conference9th International Conference on Electrical and Electronics Engineering, ELECO 2015
Country/TerritoryTurkey
CityBursa
Period11/26/1511/28/15

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