TY - JOUR
T1 - Effect of mass spectrometric sampling interface on the fundamental parameters of an inductively coupled plasma as a function of its operating conditions. Part II. Central-gas flow rate and sampling depth
AU - Gamez, Gerardo
AU - Lehn, Scott A.
AU - Huang, Mao
AU - Hieftje, Gary M.
N1 - Funding Information:
This study was supported in part by the U.S. Department of Energy through Grant DE-FG02-98ER14890.
PY - 2007/4
Y1 - 2007/4
N2 - The fundamental parameters of an inductively coupled plasma (ICP) were measured by means of Thomson and Rayleigh scattering to study the changes induced by the presence of a mass spectrometer (MS) sampling cone. The electron number density (ne), electron temperature (Te), and gas-kinetic temperature (Tg) upstream from the mass spectrometer sampler were followed while the central-gas flow rate and MS interface sampling depth were varied. The gas-kinetic temperature was found to decline at greater central-gas flow rates, an effect that was elevated in the presence of the MS interface. As the MS interface was brought closer to the ICP load coil, decreases in upstream plasma Tg ensued. Overall, changes in the upstream fundamental parameters caused by the presence of the MS interface were found to depend on operating conditions.
AB - The fundamental parameters of an inductively coupled plasma (ICP) were measured by means of Thomson and Rayleigh scattering to study the changes induced by the presence of a mass spectrometer (MS) sampling cone. The electron number density (ne), electron temperature (Te), and gas-kinetic temperature (Tg) upstream from the mass spectrometer sampler were followed while the central-gas flow rate and MS interface sampling depth were varied. The gas-kinetic temperature was found to decline at greater central-gas flow rates, an effect that was elevated in the presence of the MS interface. As the MS interface was brought closer to the ICP load coil, decreases in upstream plasma Tg ensued. Overall, changes in the upstream fundamental parameters caused by the presence of the MS interface were found to depend on operating conditions.
KW - Fundamental parameters
KW - Inductively coupled plasma mass spectrometry
KW - Mass spectrometer interface
KW - Rayleigh scattering
KW - Thomson scattering
UR - http://www.scopus.com/inward/record.url?scp=34249031585&partnerID=8YFLogxK
U2 - 10.1016/j.sab.2007.03.016
DO - 10.1016/j.sab.2007.03.016
M3 - Article
AN - SCOPUS:34249031585
SN - 0584-8547
VL - 62
SP - 370
EP - 377
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
IS - 4
ER -