TY - JOUR
T1 - Effect of mass spectrometric sampling interface on the fundamental parameters of an inductively coupled plasma as a function of its operating conditions. Part I. Applied r.f. power and vacuum
AU - Gamez, Gerardo
AU - Lehn, Scott A.
AU - Huang, Mao
AU - Hieftje, Gary M.
N1 - Funding Information:
The authors would like to acknowledge research support by the Department of Energy (Grant DE-FG02-98ER14890).
PY - 2007/4
Y1 - 2007/4
N2 - The effects of a mass-spectrometer sampling interface on the fundamental parameters of an argon inductively coupled plasma were studied. Laser-scattering techniques were used to obtain radially resolved values for electron number density (ne), electron temperature (Te), and gas-kinetic temperature (Tg) of the ICP upstream from the sampler as a function of applied r.f. power while different sample solutions were introduced. In addition, radially resolved calcium ion and atom number densities were determined under the same conditions in order to study the effects of matrix elements upstream from the mass spectrometer interface. It was found that the interface causes changes in the fundamental parameters that are dependent on the ICP applied r.f. power and the pressure at the back of the sampling interface. Furthermore, the changes caused by matrix interferents are different in the presence and in the absence of the sampler.
AB - The effects of a mass-spectrometer sampling interface on the fundamental parameters of an argon inductively coupled plasma were studied. Laser-scattering techniques were used to obtain radially resolved values for electron number density (ne), electron temperature (Te), and gas-kinetic temperature (Tg) of the ICP upstream from the sampler as a function of applied r.f. power while different sample solutions were introduced. In addition, radially resolved calcium ion and atom number densities were determined under the same conditions in order to study the effects of matrix elements upstream from the mass spectrometer interface. It was found that the interface causes changes in the fundamental parameters that are dependent on the ICP applied r.f. power and the pressure at the back of the sampling interface. Furthermore, the changes caused by matrix interferents are different in the presence and in the absence of the sampler.
KW - Effect of sampling interface
KW - Fundamental parameters
KW - Inductively coupled plasma mass spectrometry
KW - Rayleigh scattering
KW - Thomson scattering
UR - http://www.scopus.com/inward/record.url?scp=34249047066&partnerID=8YFLogxK
U2 - 10.1016/j.sab.2007.03.015
DO - 10.1016/j.sab.2007.03.015
M3 - Article
AN - SCOPUS:34249047066
SN - 0584-8547
VL - 62
SP - 357
EP - 369
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
IS - 4
ER -