Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy

Brandon L. Weeks, Mark W. Vaughn, James J. Deyoreo

Research output: Contribution to journalArticlepeer-review

163 Scopus citations

Abstract

Environmental scanning electron microscopy was used to image meniscus formation between an AFM tip and a surface. At high relative humidity, 70%-99%, the meniscus formed is 100 to 1200 nm in height, orders of magnitude larger than predicted by the Kelvin equation using spherical geometry. The height of the meniscus also demonstrates hysteresis associated with increasing or decreasing relative humidity.

Original languageEnglish
Pages (from-to)8096-8098
Number of pages3
JournalLangmuir
Volume21
Issue number18
DOIs
StatePublished - Aug 30 2005

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